ATC 2.0 Option Enables Dynamic Multisite Sensing and Regulation of Device Temperature for Optimized Test of High-End Automotive SoCs TOKYO, Oct. 24, 2023 (GLOBE NEWSWIRE) -- Leading semiconductor test ...
SAN JOSE — At the Semicon West show here today, Credence Systems Corp. rolled out the world's first desktop test system that incorporates an automated device handler. The new desktop system, called ...
TOKYO, Dec. 10, 2025 (GLOBE NEWSWIRE) -- Leading semiconductor test equipment supplier Advantest Corporation (TSE: 6857) today announced the M5241 Memory Handler, its next-generation handler developed ...
The Memory Handler M5241 delivers high-precision temperature control, maximized uptime, and enhanced maintainability to facilitate advanced memory test © Advantest ...
TOKYO, Oct. 24, 2023 (GLOBE NEWSWIRE) -- Leading semiconductor test equipment supplier Advantest Corporation (TSE: 6857) today announced a new Active Thermal Control (ATC) option for its M4841 ...
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