X-ray diffraction (XRD) is a powerful non-destructive analytical technique used to evaluate crystalline materials and determine their structural properties. As one of the most widely used ...

Researchers have developed an atom-diffraction imaging method with micrometer spatial resolution, which may allow new applications in material characterization. Microscopy with atoms offers new ...

Even a metal plate that looks smooth and uniform at a glance is made up of numerous "small crystal rooms (crystal grains)" ...

Researchers have developed a table-top extreme-ultraviolet grazing-reflection ptychography system with full-pose self-calibration for high-precision semiconductor metrology. By combining holistic ...

Diffractometers have been around for a long time and are used to analyze various types of materials and provide information regarding their structure. While there are a few different types, we’re ...