The foundation of parametric test within semiconductor manufacturing is its usefulness in determining that wafers have been fabricated properly. Foundries use parametric test results to help verify ...

Cleveland, Ohio — Keithley Instruments, Inc. has announced the availability of its Automated Characterization Suite (ACS) V3.2 software for semiconductor test and characterization at the device, wafer ...

September 25, 2014. Keithley Instruments Inc. today announced it had received orders for additional S530 parametric test systems from X-FAB Silicon Foundries. X-FAB, a Germany-based foundry for analog ...

The Mann-Whitney U Test, also known as the Wilcoxon Rank Sum Test, is a non-parametric statistical test used to compare two samples or groups. The Mann-Whitney U Test assesses whether two sampled ...

Scandinavian Journal of Statistics, Vol. 45, No. 2 (June 2018), pp. 217-254 (38 pages) Non-parametric generalized likelihood ratio test is a popular method of model checking for regressions. However, ...

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