Keithley Instruments has announced the publication of Parallel Test Technology: The New Paradigm for Parametric Testing, a handbook that covers semiconductor parametric testing. The free, 60-page book ...
SANTA ROSA, Calif.--(BUSINESS WIRE)--Keysight Technologies, Inc. (NYSE: KEYS), a leading technology company that delivers advanced design and validation solutions to help accelerate innovation to ...
Today’s devices are required to pass thousands of parametric tests prior to being shipped to customers. A key challenge test engineers face, in addition to optimizing the number of tests they run on ...
In the common non-parametric regression model the problem of testing for the parametric form of the conditional variance is considered. A stochastic process based on the difference between the ...
October 22, 2012. Keithley Instruments Inc. has introduced seven instrumentation, software, and test-fixture configurations for parametric curve-tracing applications for characterizing high-power ...
This is a preview. Log in through your library . Abstract Using a sample from an unknown bivariate distribution, we propose a test for the hypothesis that one marginal distribution is stochastically ...
Some results have been hidden because they may be inaccessible to you
Show inaccessible results