CD-SEM, the workhorse metrology tool used by fabs for process control, is facing big challenges at 5nm and below. Traditionally, CD-SEM imaging has relied on a limited number of image frames for ...
A focused ion beam scanning electron microscope (FIB-SEM) equipped with a compact time-of-flight secondary ion mass spectrometer (ToF-SIMS) 1,2 and traditional energy dispersive X-ray spectroscopy ...
A new technical paper titled “Scanning electron microscopy-based automatic defect inspection for semiconductor manufacturing: a systematic review” was published by researchers at KU Leuven and imec.
In the world of nanotechnology, where structures are measured in billionths of a meter, precise imaging and measurement techniques are essential. Critical Dimension Scanning Electron Microscopy ...
Graphene is a material that has a one-atom layer of carbon atoms with a thickness of only 335 pm. It can be modified using oxidization and functionalization. For example, graphene gains properties ...
Nanofibers have gained significant attention for different applications, such as barrier fabrics and high-efficiency filters. In biomedical applications, nanofibers have been used as drug delivery ...
Electron microscopy is a powerful technique that provides high-resolution images by focusing a beam of electrons to reveal fine structural details in biological and material specimens. 2 Because ...
Scanning electron microscope images of trona found in samples of the asteroid Bennu returned by NASA’s OSIRIS-REx mission. Trona is water-bearing sodium carbonate, also known commonly as soda ash.
Scanning electron microscope image of a Pseudomonas aeruginosa bacterium, destroyed by nanopillars, on a cicada wing. Scale bar is 1 micrometer. Credit: Yutao Chen. Disclaimer: AAAS and EurekAlert!
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