With scaling technology and increasing design sizes, power consumption during test and test data volume have grown dramatically — making it almost impossible to test an entire design once it ...
New manufacturing test challenges are raised with SoC technology advances where both test quality and test costs are affected with a direct impact on current Design-For-Test (DFT) methodologies and ...
With advanced technology nodes, the SoCs are growing in density and gate count. This creates challenges regarding the testability, and more importantly, the test cost. The design complexity and size ...
Siemens Digital Industries Software has brought out software to help IC design teams streamline and accelerate a broad array of critical design-for-test (DFT) tasks. The software enables the analysis ...
New Release Provides Support for Verilog2001 and a Wide Range of Usability Improvements across the Built-In Self-Test Product Line SAN JOSE, Calif. -- Aug. 21, 2007 -- LogicVision, Inc., a leading ...
In the real world, we are slaves to our environment. The decisions we make are dependent on the resources available at any given time. In school, I remember coming up with a binary decision diagram ...
Siemens Digital Industries Software has unveiled the Tessent RTL Pro, a software solution developed to help integrated circuit (IC) design teams streamline and accelerate a broad array of critical ...
Siemens Digital Industries Software has unveiled the Tessent RTL Pro, an innovative software solution developed to help integrated circuit (IC) design teams streamline and accelerate a broad array of ...
Some results have been hidden because they may be inaccessible to you
Show inaccessible results